Cover picture: Ellipsometric imaging of thickness, uniformity, and spatial patterns of refractive indices with supported phospholipid bilayers. The panels show a spatially resolved map of ellipsometric angle, Δ, for a photolithographically patterned DMPC bilayer on silicon substrates (left) and the corresponding spatial map of ellipsometric thicknesses resolved at micrometer level (right). See the article by Howland et al. on page 1306.